Atomic Force Microscope - Company Ranking(4 companyies in total)
Last Updated： Aggregation Period:Jul 16, 2025〜Aug 12, 2025
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Display Company Information
| Company Name | Featured Products | ||
|---|---|---|---|
| Product Image, Product Name, Price Range | overview | Application/Performance example | |
| 【Main Features】 ■ Shape Measurement (Non-contact/Contact/Tapping) ■ Electrical Properties (C-AFM/KPFM/EFM, etc.) ■ Mechanical Properties (PinPoint/LFM/FMM, etc.) ■ Induction Properties/Piezoelectric Properties (PFM, etc.) ■ Magnetic Properties (MFM) *For more details, please refer to the PDF document or feel free to contact us. | For more details, please refer to the PDF document or feel free to contact us. | ||
| 【Specifications】 ■System Specifications: Electric XY Stage ・200 mm: Drive 275 mm × 200 mm, Resolution 0.5 µm ・300 mm: Drive 375 mm × 300 mm, Resolution 0.5 µm ■XY Scanner Range: Single Module Flexure Type Closed Loop XY Scanner ・100 µm × 100 µm (Large Mode) ・50 µm × 50 µm (Medium Mode) ・10 µm × 10 µm (Small Mode) *For more details, please refer to the PDF document or feel free to contact us. | 【Usage】 ■ The only wafer inspection AFM equipped with an automatic defect review function. *For more details, please refer to the PDF document or feel free to contact us. | ||
| 【System Specifications】 ■ Electric XY Stage ・200mm: Drive 275mm x 200mm, Resolution 0.5μm ・300mm: Drive 375mm x 300mm, Resolution 0.5μm ■ Electric Z Stage ・Z Drive Distance: 30mm ・Resolution: 0.08μm, Repeatability < 1μm ■ Electric Focus Stage ・Z Drive Distance: 11mm, Direct Optical System *For more details, please download the PDF or feel free to contact us. | For more details, please download the PDF or feel free to contact us. | ||
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パーク・システムズ・ジャパン
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- Featured Products
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Atomic Force Microscope (AFM) "Park NX10"
- overview
- 【Main Features】 ■ Shape Measurement (Non-contact/Contact/Tapping) ■ Electrical Properties (C-AFM/KPFM/EFM, etc.) ■ Mechanical Properties (PinPoint/LFM/FMM, etc.) ■ Induction Properties/Piezoelectric Properties (PFM, etc.) ■ Magnetic Properties (MFM) *For more details, please refer to the PDF document or feel free to contact us.
- Application/Performance example
- For more details, please refer to the PDF document or feel free to contact us.
Atomic Force Microscope "Park NX-Wafer"
- overview
- 【Specifications】 ■System Specifications: Electric XY Stage ・200 mm: Drive 275 mm × 200 mm, Resolution 0.5 µm ・300 mm: Drive 375 mm × 300 mm, Resolution 0.5 µm ■XY Scanner Range: Single Module Flexure Type Closed Loop XY Scanner ・100 µm × 100 µm (Large Mode) ・50 µm × 50 µm (Medium Mode) ・10 µm × 10 µm (Small Mode) *For more details, please refer to the PDF document or feel free to contact us.
- Application/Performance example
- 【Usage】 ■ The only wafer inspection AFM equipped with an automatic defect review function. *For more details, please refer to the PDF document or feel free to contact us.
Atomic Force Microscope (AFM) "Park NX-3DM"
- overview
- 【System Specifications】 ■ Electric XY Stage ・200mm: Drive 275mm x 200mm, Resolution 0.5μm ・300mm: Drive 375mm x 300mm, Resolution 0.5μm ■ Electric Z Stage ・Z Drive Distance: 30mm ・Resolution: 0.08μm, Repeatability < 1μm ■ Electric Focus Stage ・Z Drive Distance: 11mm, Direct Optical System *For more details, please download the PDF or feel free to contact us.
- Application/Performance example
- For more details, please download the PDF or feel free to contact us.
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パーク・システムズ・ジャパン
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